Computer Engineering Publications Database (2000-2018) Yield Improvement and Test Cost Optimization for 3D Stacked ICs
| Publication Type | Conference Paper |
|---|---|
| Title | Yield Improvement and Test Cost Optimization for 3D Stacked ICs |
| Author(s) | S. Hamdioui M. Taouil |
| Publication Date | November 2011 |
| Conference Name | 20th Asian Test Symposium |
| Period | 20-23 November 2011 |
| Location | New Delhi, India |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and M. Taouil",
title = "Yield Improvement and Test Cost Optimization for 3D Stacked ICs",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}
author = "S. Hamdioui and M. Taouil",
title = "Yield Improvement and Test Cost Optimization for 3D Stacked ICs",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = ""
}