Importance of Dynamic Faults for New SRAM Technologies 1035_importance_of_dynamic_faults_for_new_sram_technologies.pdf

Publication TypeConference Paper
TitleImportance of Dynamic Faults for New SRAM Technologies
Author(s)S. Hamdioui
R. Wadsworth
J.D. Reyes
A.J. van de Goor
Publication DateMay 2003
Conference Name8th IEEE European Test Workshop
Period25-28 May 2003
LocationMaastricht, The Netherlands
ISBNt.b.s.
Page Numbers29-34
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and R. Wadsworth and J.D. Reyes and A.J. van de Goor",
title = "Importance of Dynamic Faults for New SRAM Technologies",
booktitle = "Proc. 8th IEEE European Test Workshop",
address = "Maastricht, The Netherlands ",
month = "May",
year = "2003",
pages = "29-34"
}