Importance of Dynamic Faults for New SRAM Technologies
Publication Type | Conference Paper |
---|---|
Title | Importance of Dynamic Faults for New SRAM Technologies |
Author(s) | S. Hamdioui R. Wadsworth J.D. Reyes A.J. van de Goor |
Publication Date | May 2003 |
Conference Name | 8th IEEE European Test Workshop |
Period | 25-28 May 2003 |
Location | Maastricht, The Netherlands |
ISBN | t.b.s. |
Page Numbers | 29-34 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and R. Wadsworth and J.D. Reyes and A.J. van de Goor",
title = "Importance of Dynamic Faults for New SRAM Technologies",
booktitle = "Proc. 8th IEEE European Test Workshop",
address = "Maastricht, The Netherlands ",
month = "May",
year = "2003",
pages = "29-34"
}
author = "S. Hamdioui and R. Wadsworth and J.D. Reyes and A.J. van de Goor",
title = "Importance of Dynamic Faults for New SRAM Technologies",
booktitle = "Proc. 8th IEEE European Test Workshop",
address = "Maastricht, The Netherlands ",
month = "May",
year = "2003",
pages = "29-34"
}