Computer Engineering Publications Database (2000-2018) Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests 
| Publication Type | Journal Paper |
|---|---|
| Title | Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests |
| Author(s) | S. Hamdioui Z. Al-Ars A.J. van de Goor M. Rodgers |
| Publication Date | April 2003 |
| Journal Name | Journal of Electronic Testing: Theory and Applications |
| Volume | 19 |
| Issue | 2 |
| Page Numbers | 195-205 |
| ISSN | 0923-8174 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and M. Rodgers",
title = "Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "19",
issue = "2",
month = "April",
year = "2003",
pages = "195-205"
}
author = "S. Hamdioui and Z. Al-Ars and A.J. van de Goor and M. Rodgers",
title = "Dynamic Faults in Random-Access-Memories: Concept, Fault Models and Tests",
journal = "Journal of Electronic Testing: Theory and Applications",
volume = "19",
issue = "2",
month = "April",
year = "2003",
pages = "195-205"
}