Computer Engineering Publications Database (2000-2018) Detecting intra-word faults in word-oriented memories 
| Publication Type | Conference Paper |
|---|---|
| Title | Detecting intra-word faults in word-oriented memories |
| Author(s) | S. Hamdioui A.J. van de Goor M. Rodgers |
| Publication Date | April 2003 |
| Conference Name | 21st IEEE VLSI Test Symposium |
| Period | 27 April - 1 May 2003 |
| Location | Napa Valley, USA |
| ISBN | 0-7695-1924-5 |
| Page Numbers | 241-247 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and A.J. van de Goor and M. Rodgers",
title = "Detecting intra-word faults in word-oriented memories",
booktitle = "Proc. 21st IEEE VLSI Test Symposium",
address = "Napa Valley, USA",
month = "April",
year = "2003",
pages = "241-247"
}
author = "S. Hamdioui and A.J. van de Goor and M. Rodgers",
title = "Detecting intra-word faults in word-oriented memories",
booktitle = "Proc. 21st IEEE VLSI Test Symposium",
address = "Napa Valley, USA",
month = "April",
year = "2003",
pages = "241-247"
}