Computer Engineering Publications Database (2000-2018) Consequences of RAM bitline twisting for test coverage 
| Publication Type | Conference Paper |
|---|---|
| Title | Consequences of RAM bitline twisting for test coverage |
| Author(s) | I. Schanstra A.J. van de Goor |
| Publication Date | March 2003 |
| Conference Name | Design, Automation and Test in Europe Conference and Exposition |
| Period | 3-7 March 2003 |
| Location | Munich, Germany |
| ISBN | 0-7695-1870-2 |
| Page Numbers | 1176-1177 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "I. Schanstra and A.J. van de Goor",
title = "Consequences of RAM bitline twisting for test coverage",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Munich, Germany",
month = "March",
year = "2003",
pages = "1176-1177"
}
author = "I. Schanstra and A.J. van de Goor",
title = "Consequences of RAM bitline twisting for test coverage",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Munich, Germany",
month = "March",
year = "2003",
pages = "1176-1177"
}