Consequences of RAM bitline twisting for test coverage 1047_consequences_of_ram_bitline_twisting_for_test_coverage.pdf

Publication TypeConference Paper
TitleConsequences of RAM bitline twisting for test coverage
Author(s)I. Schanstra
A.J. van de Goor
Publication DateMarch 2003
Conference NameDesign, Automation and Test in Europe Conference and Exposition
Period3-7 March 2003
LocationMunich, Germany
ISBN0-7695-1870-2
Page Numbers1176-1177
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "I. Schanstra and A.J. van de Goor",
title = "Consequences of RAM bitline twisting for test coverage",
booktitle = "Proc. Design, Automation and Test in Europe Conference and Exposition",
address = "Munich, Germany",
month = "March",
year = "2003",
pages = "1176-1177"
}