Evaluation Methodology for Single Electron Encoded Threshold Logic Gates 1050_evaluation_methodology_for_single_electron_encoded_threshol.pdf

Publication TypeConference Paper
TitleEvaluation Methodology for Single Electron Encoded Threshold Logic Gates
Author(s)C.R. Lageweg
S.D. Cotofana
S. Vassiliadis
Publication DateDecember 2003
Conference NameInternational Conference on Very Large Scale Integration of System-on-Chip
Period1-3 December 2003
LocationDarmstadt, Germany
ISBN3-901882-17-0
Page Numbers258-262
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "C.R. Lageweg and S.D. Cotofana and S. Vassiliadis",
title = "Evaluation Methodology for Single Electron Encoded Threshold Logic Gates",
booktitle = "Proc. International Conference on Very Large Scale Integration of System-on-Chip",
address = "Darmstadt, Germany",
month = "December",
year = "2003",
pages = "258-262"
}