Evaluation Methodology for Single Electron Encoded Threshold Logic Gates
Publication Type | Conference Paper |
---|---|
Title | Evaluation Methodology for Single Electron Encoded Threshold Logic Gates |
Author(s) | C.R. Lageweg S.D. Cotofana S. Vassiliadis |
Publication Date | December 2003 |
Conference Name | International Conference on Very Large Scale Integration of System-on-Chip |
Period | 1-3 December 2003 |
Location | Darmstadt, Germany |
ISBN | 3-901882-17-0 |
Page Numbers | 258-262 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "C.R. Lageweg and S.D. Cotofana and S. Vassiliadis",
title = "Evaluation Methodology for Single Electron Encoded Threshold Logic Gates",
booktitle = "Proc. International Conference on Very Large Scale Integration of System-on-Chip",
address = "Darmstadt, Germany",
month = "December",
year = "2003",
pages = "258-262"
}
author = "C.R. Lageweg and S.D. Cotofana and S. Vassiliadis",
title = "Evaluation Methodology for Single Electron Encoded Threshold Logic Gates",
booktitle = "Proc. International Conference on Very Large Scale Integration of System-on-Chip",
address = "Darmstadt, Germany",
month = "December",
year = "2003",
pages = "258-262"
}