Future Challenges in Memory Testing 1064_future_challenges_in_memory_testing.pdf

Publication TypeConference Paper
TitleFuture Challenges in Memory Testing
Author(s)S. Hamdioui
G.N. Gaydadjiev
Publication DateNovember 2003
Conference Name14th Annual Workshop on Circuits, Systems and Signal Processing
Period27-29 November 2003
LocationVeldhoven, The Netherlands
ISBNt.b.s.
Page Numbers78-83
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and G.N. Gaydadjiev",
title = "Future Challenges in Memory Testing",
booktitle = "Proc. 14th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2003",
pages = "78-83"
}