Future Challenges in Memory Testing
Publication Type | Conference Paper |
---|---|
Title | Future Challenges in Memory Testing |
Author(s) | S. Hamdioui G.N. Gaydadjiev |
Publication Date | November 2003 |
Conference Name | 14th Annual Workshop on Circuits, Systems and Signal Processing |
Period | 27-29 November 2003 |
Location | Veldhoven, The Netherlands |
ISBN | t.b.s. |
Page Numbers | 78-83 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and G.N. Gaydadjiev",
title = "Future Challenges in Memory Testing",
booktitle = "Proc. 14th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2003",
pages = "78-83"
}
author = "S. Hamdioui and G.N. Gaydadjiev",
title = "Future Challenges in Memory Testing",
booktitle = "Proc. 14th Annual Workshop on Circuits, Systems and Signal Processing",
address = "Veldhoven, The Netherlands",
month = "November",
year = "2003",
pages = "78-83"
}