Computer Engineering Publications Database (2000-2018) Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces 
| Publication Type | Conference Paper |
|---|---|
| Title | Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | November 2003 |
| Conference Name | 12th Asian Test Symposium |
| Period | 17-19 November 2003 |
| Location | Xian, China |
| ISBN | 0-7695-1951-2 |
| Page Numbers | 24-27 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces",
booktitle = "Proc. 12th Asian Test Symposium",
address = "Xian, China",
month = "November",
year = "2003",
pages = "24-27"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Analyzing the Impact of Process Variations on DRAM Testing Using Border Resistance Traces",
booktitle = "Proc. 12th Asian Test Symposium",
address = "Xian, China",
month = "November",
year = "2003",
pages = "24-27"
}