Computer Engineering Publications Database (2000-2018) Test generation and optimization for DRAM cell defects using electrical simulation 
| Publication Type | Journal Paper |
|---|---|
| Title | Test generation and optimization for DRAM cell defects using electrical simulation |
| Author(s) | Z. Al-Ars A.J. van de Goor |
| Publication Date | October 2003 |
| Journal Name | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
| Volume | 22 |
| Issue | 10 |
| Page Numbers | 1371-1384 |
| ISSN | 0278-0070 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Test generation and optimization for DRAM cell defects using electrical simulation",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "22",
issue = "10",
month = "October",
year = "2003",
pages = "1371-1384"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Test generation and optimization for DRAM cell defects using electrical simulation",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "22",
issue = "10",
month = "October",
year = "2003",
pages = "1371-1384"
}