Computer Engineering Publications Database (2000-2018) Testing (embedded) memories : new fault models, test, Dft, BIST, BISR and industrial results
| Publication Type | Conference Paper |
|---|---|
| Title | Testing (embedded) memories : new fault models, test, Dft, BIST, BISR and industrial results |
| Author(s) | A.J. van de Goor |
| Publication Date | May 2003 |
| Conference Name | 8th IEEE European Test Workshop |
| Period | 25-28 May 2003 |
| Location | Maastricht, The Netherlands |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor",
title = "Testing (embedded) memories : new fault models, test, Dft, BIST, BISR and industrial results",
booktitle = "Proc. 8th IEEE European Test Workshop",
address = "Maastricht, The Netherlands ",
month = "May",
year = "2003",
pages = ""
}
author = "A.J. van de Goor",
title = "Testing (embedded) memories : new fault models, test, Dft, BIST, BISR and industrial results",
booktitle = "Proc. 8th IEEE European Test Workshop",
address = "Maastricht, The Netherlands ",
month = "May",
year = "2003",
pages = ""
}