Computer Engineering Publications Database (2000-2018) Logical and topological testing of scrambled RAMs
| Publication Type | Conference Paper |
|---|---|
| Title | Logical and topological testing of scrambled RAMs |
| Author(s) | I. Schanstra A.J. van de Goor |
| Publication Date | February 2003 |
| Conference Name | 4th IEEE Latin American Test Workshop |
| Period | 16-19 February 2003 |
| Location | Natal, Brazil |
| ISBN | t.b.s. |
| Page Numbers | 66-71 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "I. Schanstra and A.J. van de Goor",
title = "Logical and topological testing of scrambled RAMs",
booktitle = "Proc. 4th IEEE Latin American Test Workshop",
address = "Natal, Brazil",
month = "February",
year = "2003",
pages = "66-71"
}
author = "I. Schanstra and A.J. van de Goor",
title = "Logical and topological testing of scrambled RAMs",
booktitle = "Proc. 4th IEEE Latin American Test Workshop",
address = "Natal, Brazil",
month = "February",
year = "2003",
pages = "66-71"
}