Computer Engineering Publications Database (2000-2018) Efficient Tests for Realistic Faults in Dual-Port Memories
| Publication Type | Journal Paper |
|---|---|
| Title | Efficient Tests for Realistic Faults in Dual-Port Memories |
| Author(s) | S. Hamdioui A.J. van de Goor |
| Publication Date | May 2002 |
| Journal Name | IEEE Transactions on Computers |
| Volume | 51 |
| Issue | 5 |
| Page Numbers | 460-473 |
| ISSN | 0018-9340 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and A.J. van de Goor",
title = "Efficient Tests for Realistic Faults in Dual-Port Memories",
journal = "IEEE Transactions on Computers",
volume = "51",
issue = "5",
month = "May",
year = "2002",
pages = "460-473"
}
author = "S. Hamdioui and A.J. van de Goor",
title = "Efficient Tests for Realistic Faults in Dual-Port Memories",
journal = "IEEE Transactions on Computers",
volume = "51",
issue = "5",
month = "May",
year = "2002",
pages = "460-473"
}