Approximating Infinite Dynamic Behavior for DRAM Cell Defects 1121_approximating_infinite_dynamic_behavior_for_dram_cell_defec.pdf

Publication TypeConference Paper
TitleApproximating Infinite Dynamic Behavior for DRAM Cell Defects
Author(s)Z. Al-Ars
A.J. van de Goor
Publication DateApril 2002
Conference Name20th IEEE VLSI Test Symposium
Period28 April - 2 May 2002
LocationMonterey, USA
ISBN0-7695-1570-3
Page Numbers401-406
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Approximating Infinite Dynamic Behavior for DRAM Cell Defects",
booktitle = "Proc. 20th IEEE VLSI Test Symposium",
address = "Monterey, USA",
month = "April",
year = "2002",
pages = "401-406"
}