Approximating Infinite Dynamic Behavior for DRAM Cell Defects
Publication Type | Conference Paper |
---|---|
Title | Approximating Infinite Dynamic Behavior for DRAM Cell Defects |
Author(s) | Z. Al-Ars A.J. van de Goor |
Publication Date | April 2002 |
Conference Name | 20th IEEE VLSI Test Symposium |
Period | 28 April - 2 May 2002 |
Location | Monterey, USA |
ISBN | 0-7695-1570-3 |
Page Numbers | 401-406 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor",
title = "Approximating Infinite Dynamic Behavior for DRAM Cell Defects",
booktitle = "Proc. 20th IEEE VLSI Test Symposium",
address = "Monterey, USA",
month = "April",
year = "2002",
pages = "401-406"
}
author = "Z. Al-Ars and A.J. van de Goor",
title = "Approximating Infinite Dynamic Behavior for DRAM Cell Defects",
booktitle = "Proc. 20th IEEE VLSI Test Symposium",
address = "Monterey, USA",
month = "April",
year = "2002",
pages = "401-406"
}