Computer Engineering Publications Database (2000-2018) Thorough Tesing Any Multi-Port Memory with Linear Tests
| Publication Type | Journal Paper |
|---|---|
| Title | Thorough Tesing Any Multi-Port Memory with Linear Tests |
| Author(s) | S. Hamdioui A.J. van de Goor |
| Publication Date | February 2002 |
| Journal Name | IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems |
| Volume | 21 |
| Issue | 2 |
| Page Numbers | 217-231 |
| ISSN | 0278-0070 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "S. Hamdioui and A.J. van de Goor",
title = "Thorough Tesing Any Multi-Port Memory with Linear Tests",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "21",
issue = "2",
month = "February",
year = "2002",
pages = "217-231"
}
author = "S. Hamdioui and A.J. van de Goor",
title = "Thorough Tesing Any Multi-Port Memory with Linear Tests",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "21",
issue = "2",
month = "February",
year = "2002",
pages = "217-231"
}