Thorough Tesing Any Multi-Port Memory with Linear Tests

Publication TypeJournal Paper
TitleThorough Tesing Any Multi-Port Memory with Linear Tests
Author(s)S. Hamdioui
A.J. van de Goor
Publication DateFebruary 2002
Journal NameIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
Volume21
Issue2
Page Numbers217-231
ISSN0278-0070
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "S. Hamdioui and A.J. van de Goor",
title = "Thorough Tesing Any Multi-Port Memory with Linear Tests",
journal = "IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems",
volume = "21",
issue = "2",
month = "February",
year = "2002",
pages = "217-231"
}