Test point insertion that facilitates ATPG in reducing test time and data volume 1157_test_point_insertion_that_facilitates_atpg_in_reducing_test.pdf

Publication TypeConference Paper
TitleTest point insertion that facilitates ATPG in reducing test time and data volume
Author(s)M.J. Geuzebroek
J. van der Linden
A.J. van de Goor
Publication DateOctober 2002
Conference NameIEEE International Test Conference
Period7-10 October 2002
LocationBaltimore, USA
ISBNt.b.s.
Page Numbers138-148
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M.J. Geuzebroek and J. van der Linden and A.J. van de Goor",
title = "Test point insertion that facilitates ATPG in reducing test time and data volume",
booktitle = "Proc. IEEE International Test Conference",
address = "Baltimore, USA",
month = "October",
year = "2002",
pages = "138-148"
}