Computer Engineering Publications Database (2000-2018) Test point insertion that facilitates ATPG in reducing test time and data volume 
| Publication Type | Conference Paper |
|---|---|
| Title | Test point insertion that facilitates ATPG in reducing test time and data volume |
| Author(s) | M.J. Geuzebroek J. van der Linden A.J. van de Goor |
| Publication Date | October 2002 |
| Conference Name | IEEE International Test Conference |
| Period | 7-10 October 2002 |
| Location | Baltimore, USA |
| ISBN | t.b.s. |
| Page Numbers | 138-148 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.J. Geuzebroek and J. van der Linden and A.J. van de Goor",
title = "Test point insertion that facilitates ATPG in reducing test time and data volume",
booktitle = "Proc. IEEE International Test Conference",
address = "Baltimore, USA",
month = "October",
year = "2002",
pages = "138-148"
}
author = "M.J. Geuzebroek and J. van der Linden and A.J. van de Goor",
title = "Test point insertion that facilitates ATPG in reducing test time and data volume",
booktitle = "Proc. IEEE International Test Conference",
address = "Baltimore, USA",
month = "October",
year = "2002",
pages = "138-148"
}