Computer Engineering Publications Database (2000-2018) Address and data scrambling: causes and impact on memory tests 
| Publication Type | Conference Paper |
|---|---|
| Title | Address and data scrambling: causes and impact on memory tests |
| Author(s) | A.J. van de Goor I. Schanstra |
| Publication Date | January 2002 |
| Conference Name | 1st IEEE International Workshop on Electronic Design, Test and Applications |
| Period | 29-31 January 200 |
| Location | Christchurch, New Zealand |
| ISBN | 0-7695-1453-7 |
| Page Numbers | 128-137 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A.J. van de Goor and I. Schanstra",
title = "Address and data scrambling: causes and impact on memory tests",
booktitle = "Proc. 1st IEEE International Workshop on Electronic Design, Test and Applications",
address = "Christchurch, New Zealand",
month = "January",
year = "2002",
pages = "128-137"
}
author = "A.J. van de Goor and I. Schanstra",
title = "Address and data scrambling: causes and impact on memory tests",
booktitle = "Proc. 1st IEEE International Workshop on Electronic Design, Test and Applications",
address = "Christchurch, New Zealand",
month = "January",
year = "2002",
pages = "128-137"
}