Development of a DRAM simulation model for fault analysis purposes 1210_development_of_a_dram_simulation_model_for_fault_analysis_p.pdf

Publication TypeConference Paper
TitleDevelopment of a DRAM simulation model for fault analysis purposes
Author(s)Z. Al-Ars
A.J. van de Goor
J. Braun
B. Gauch
D. Richter
W. Spirkl
Publication DateFebruary 2001
Conference Name13th Workshop on Testmethods and Reliability of Circuits and Systems
Period18–20 February 2001
LocationMiesbach, Germany
ISBNt.b.s.
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor and J. Braun and B. Gauch and D. Richter and W. Spirkl",
title = "Development of a DRAM simulation model for fault analysis purposes",
booktitle = "Proc. 13th Workshop on Testmethods and Reliability of Circuits and Systems",
address = "Miesbach, Germany",
month = "February",
year = "2001",
pages = ""
}