Computer Engineering Publications Database (2000-2018) Tests for resistive and capacitive defects in address decoders
| Publication Type | Conference Paper |
|---|---|
| Title | Tests for resistive and capacitive defects in address decoders |
| Author(s) | M. Klaus A.J. van de Goor |
| Publication Date | November 2001 |
| Conference Name | 10th Asian Test Symposium |
| Period | 19-21 November 2001 |
| Location | Kyoto, Japan |
| ISBN | 0-7695-1378-6 |
| Page Numbers | 31-36 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Klaus and A.J. van de Goor",
title = "Tests for resistive and capacitive defects in address decoders",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "31-36"
}
author = "M. Klaus and A.J. van de Goor",
title = "Tests for resistive and capacitive defects in address decoders",
booktitle = "Proc. 10th Asian Test Symposium",
address = "Kyoto, Japan",
month = "November",
year = "2001",
pages = "31-36"
}