Computer Engineering Publications Database (2000-2018) Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs 
| Publication Type | Conference Paper |
|---|---|
| Title | Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs |
| Author(s) | Z. Al-Ars A.J. van de Goor J. Braun D. Richter |
| Publication Date | October 2001 |
| Conference Name | IEEE International Test Conference |
| Period | 30 October - 1 November 2001 |
| Location | Baltimore, USA |
| ISBN | 0-7803-7169-0 |
| Page Numbers | 783-792 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars and A.J. van de Goor and J. Braun and D. Richter",
title = "Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs",
booktitle = "Proc. IEEE International Test Conference",
address = "Baltimore, USA",
month = "October",
year = "2001",
pages = "783-792"
}
author = "Z. Al-Ars and A.J. van de Goor and J. Braun and D. Richter",
title = "Simulation based analysis of temperature effect on the faulty behaviour of embedded DRAMs",
booktitle = "Proc. IEEE International Test Conference",
address = "Baltimore, USA",
month = "October",
year = "2001",
pages = "783-792"
}