Computer Engineering Publications Database (2000-2018) March tests for realistic faults in two-port memories 
| Publication Type | Conference Paper |
|---|---|
| Title | March tests for realistic faults in two-port memories |
| Author(s) | S. Hamdioui A.J. van de Goor M. Rodgers D. Eastwick |
| Publication Date | August 2000 |
| Conference Name | 8th IEEE International Workshop on Memory Technology, Design, and Testing |
| Period | 7-8 August 2000 |
| Location | San Jose, USA |
| ISBN | 0-7695-0689-5 |
| Page Numbers | 73-78 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and A.J. van de Goor and M. Rodgers and D. Eastwick",
title = "March tests for realistic faults in two-port memories",
booktitle = "Proc. 8th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2000",
pages = "73-78"
}
author = "S. Hamdioui and A.J. van de Goor and M. Rodgers and D. Eastwick",
title = "March tests for realistic faults in two-port memories",
booktitle = "Proc. 8th IEEE International Workshop on Memory Technology, Design, and Testing",
address = "San Jose, USA",
month = "August",
year = "2000",
pages = "73-78"
}