Computer Engineering Publications Database (2000-2018) An experimental analysis of spot defects in SRAMs: realistic fault models and test 
| Publication Type | Conference Paper |
|---|---|
| Title | An experimental analysis of spot defects in SRAMs: realistic fault models and test |
| Author(s) | S. Hamdioui A.J. van de Goor |
| Publication Date | December 2000 |
| Conference Name | 9th Asian Test Symposium |
| Period | 4-6 December 2000 |
| Location | Taipei, Taiwan |
| ISBN | 0-7695-0887-1 |
| Page Numbers | 131-138 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "S. Hamdioui and A.J. van de Goor",
title = "An experimental analysis of spot defects in SRAMs: realistic fault models and test",
booktitle = "Proc. 9th Asian Test Symposium",
address = "Taipei, Taiwan",
month = "December",
year = "2000",
pages = "131-138"
}
author = "S. Hamdioui and A.J. van de Goor",
title = "An experimental analysis of spot defects in SRAMs: realistic fault models and test",
booktitle = "Proc. 9th Asian Test Symposium",
address = "Taipei, Taiwan",
month = "December",
year = "2000",
pages = "131-138"
}