Computer Engineering Publications Database (2000-2018) Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity 
| Publication Type | Conference Proceedings |
|---|---|
| Title | Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity |
| Author(s) | M.S. Khan S. Hamdioui M. Taouil H. Kukner P. Raghavan F. Catthoor |
| Publication Date | December 2012 |
| Conference Name | International Design & Test Symposium |
| Period | 15-17 December 2012 |
| Location | Doha, Qatar |
| ISBN | asddf |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "M.S. Khan and S. Hamdioui and M. Taouil and H. Kukner and P. Raghavan and F. Catthoor",
title = "Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity",
conference = "International Design & Test Symposium",
address = "Doha, Qatar",
month = "December",
year = "2012",
editors = ""
}
author = "M.S. Khan and S. Hamdioui and M. Taouil and H. Kukner and P. Raghavan and F. Catthoor",
title = "Impact of Partial Resistive Defects and Bias Temperature Instability on SRAM Decoder Reliablity",
conference = "International Design & Test Symposium",
address = "Doha, Qatar",
month = "December",
year = "2012",
editors = ""
}