Critical Transistors Nexus Based Circuit-Level Aging Assessment and Prediction
Publication Type | Journal Paper |
---|---|
Title | Critical Transistors Nexus Based Circuit-Level Aging Assessment and Prediction |
Author(s) | N. Cucu Laurenciu S.D. Cotofana |
Publication Date | June 2014 |
Journal Name | Journal of Parallel and Distributed Computing |
Volume | 74 |
Issue | 6 |
Page Numbers | 2512–2520 |
ISSN | 0743-7315 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | Reliability |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "N. Cucu Laurenciu and S.D. Cotofana",
title = "Critical Transistors Nexus Based Circuit-Level Aging Assessment and Prediction",
journal = "Journal of Parallel and Distributed Computing",
volume = "74",
issue = "6",
month = "June",
year = "2014",
pages = "2512–2520"
}
author = "N. Cucu Laurenciu and S.D. Cotofana",
title = "Critical Transistors Nexus Based Circuit-Level Aging Assessment and Prediction",
journal = "Journal of Parallel and Distributed Computing",
volume = "74",
issue = "6",
month = "June",
year = "2014",
pages = "2512–2520"
}