Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits 1392_bias_temperature_instability_analysis_monitoring_and_mitig.pdf

Publication TypePhd Thesis
TitleBias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits
Author(s)M.S. Khan
Promotor(s)S. Hamdioui
K.L.M. Bertels
Publication DateSeptember 2013
ISBN978-94-6186-209-9
Selected PublicationNo
Note
Topic(s)Reliability
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@phdthesis{,
author = "M.S. Khan",
title = "Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-scaled Circuits",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "September",
year = "2013"
}