Computer Engineering Publications Database (2000-2018) Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices 
| Publication Type | Phd Thesis |
|---|---|
| Title | Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices |
| Author(s) | I.S. Irobi |
| Promotor(s) | Z. Al-Ars |
| Publication Date | September 2011 |
| ISBN | 978-90-72298-22-5 |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@phdthesis{,
author = "I.S. Irobi",
title = "Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "September",
year = "2011"
}
author = "I.S. Irobi",
title = "Analysis and Test Development for Parasitic Fails in Deep Sub-Micron Memory Devices",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "September",
year = "2011"
}