Computer Engineering Publications Database (2000-2018) Bias temperature instability analysis in SRAM decoder
| Publication Type | Conference Paper |
|---|---|
| Title | Bias temperature instability analysis in SRAM decoder |
| Author(s) | M.S. Khan S. Hamdioui H. Kukner P. Raghavan F. Catthoor |
| Publication Date | May 2013 |
| Conference Name | 18th IEEE European Test Symposium |
| Period | 27-31 May 2013 |
| Location | Avignon, France |
| ISBN | 978-1-4673-6377-8/13/ |
| Page Numbers | 1 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M.S. Khan and S. Hamdioui and H. Kukner and P. Raghavan and F. Catthoor",
title = "Bias temperature instability analysis in SRAM decoder",
booktitle = "Proc. 18th IEEE European Test Symposium",
address = "Avignon, France",
month = "May",
year = "2013",
pages = "1"
}
author = "M.S. Khan and S. Hamdioui and H. Kukner and P. Raghavan and F. Catthoor",
title = "Bias temperature instability analysis in SRAM decoder",
booktitle = "Proc. 18th IEEE European Test Symposium",
address = "Avignon, France",
month = "May",
year = "2013",
pages = "1"
}