Computer Engineering Publications Database (2000-2018) Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-Scaled Circuits
| Publication Type | Phd Thesis |
|---|---|
| Title | Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-Scaled Circuits |
| Author(s) | M.S. Khan |
| Promotor(s) | S. Hamdioui K.L.M. Bertels |
| Publication Date | September 2013 |
| ISBN | 978-94-6186-209-9 |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@phdthesis{,
author = "M.S. Khan",
title = "Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-Scaled Circuits",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "September",
year = "2013"
}
author = "M.S. Khan",
title = "Bias Temperature Instability Analysis, Monitoring and Mitigation for Nano-Scaled Circuits",
school = "Delft University of Technology",
address = "Delft, Netherlands",
month = "September",
year = "2013"
}