Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers 1417_automated_dft_insertion_and_test_generation_for_3dsics_wit.pdf

Publication TypeConference Proceedings
TitleAutomated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Author(s)C. Papameletis,
B. Keller
V. Chickermane
E.J. Marinissen
Publication DateMay 2013
Conference Name18th IEEE European Test Symposium
Period27-31 May 2013
LocationAvignon, France
ISBN978-1-4673-6377-8
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)3D Stacking
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "C. Papameletis, and B. Keller and V. Chickermane and E.J. Marinissen",
title = "Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers",
conference = "18th IEEE European Test Symposium",
address = "Avignon, France",
month = "May",
year = "2013",
editors = ""
}