Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers
Publication Type | Conference Paper |
---|---|
Title | Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers |
Author(s) | C. Papameletis, B. Keller V. Chickermane E.J. Marinissen S. Hamdioui |
Publication Date | May 2013 |
Conference Name | 18th IEEE European Test Symposium |
Period | 27-31 May 2013 |
Location | Avignon, France |
ISBN | 978-1-4673-6377-8/13/ |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | 3D Stacking |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "C. Papameletis, and B. Keller and V. Chickermane and E.J. Marinissen and S. Hamdioui",
title = "Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers",
booktitle = "Proc. 18th IEEE European Test Symposium",
address = "Avignon, France",
month = "May",
year = "2013",
pages = ""
}
author = "C. Papameletis, and B. Keller and V. Chickermane and E.J. Marinissen and S. Hamdioui",
title = "Automated DfT insertion and test generation for 3D-SICs with embedded cores and multiple towers",
booktitle = "Proc. 18th IEEE European Test Symposium",
address = "Avignon, France",
month = "May",
year = "2013",
pages = ""
}