An efficient method for the test of embedded memory cores during the operational phase

Publication TypeConference Proceedings
TitleAn efficient method for the test of embedded memory cores during the operational phase
Author(s)L.M. Ciganda
P. Bernardi
M. Sonza Reorda
S. Hamdioui
Publication DateNovember 2013
Conference Name22nd Asian Test Symposium
Period18-21 November 2013
LocationYilan, Taiwan
ISBNtbd
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "L.M. Ciganda and P. Bernardi and M. Sonza Reorda and S. Hamdioui",
title = "An efficient method for the test of embedded memory cores during the operational phase",
conference = "22nd Asian Test Symposium",
address = "Yilan, Taiwan",
month = "November",
year = "2013",
editors = ""
}