Computer Engineering Publications Database (2000-2018) A New Test Paradigm for Semiconductor Memories in the Nano-Era
| Publication Type | Conference Paper |
|---|---|
| Title | A New Test Paradigm for Semiconductor Memories in the Nano-Era |
| Author(s) | Z. Al-Ars |
| Publication Date | November 2011 |
| Conference Name | 20th Asian Test Symposium |
| Period | 20-23 November 2011 |
| Location | New Delhi, India |
| ISBN | 978-1-4577-1984-4 |
| Page Numbers | 347-352 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "Z. Al-Ars",
title = "A New Test Paradigm for Semiconductor Memories in the Nano-Era",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = "347-352"
}
author = "Z. Al-Ars",
title = "A New Test Paradigm for Semiconductor Memories in the Nano-Era",
booktitle = "Proc. 20th Asian Test Symposium",
address = "New Delhi, India",
month = "November",
year = "2011",
pages = "347-352"
}