Interconnect Test for 3D Stacked Memory-on-Logic
Publication Type | Conference Proceedings |
---|---|
Title | Interconnect Test for 3D Stacked Memory-on-Logic |
Author(s) | M. Taouil M. Masadeh S. Hamdioui E.J. Marinissen |
Publication Date | March 2014 |
Conference Name | Design, Automation & Test in Europe |
Period | 24-28 March 2014 |
Location | Dresden, Germany |
ISBN | 9783981537024 |
Editor(s) | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | 3D Stacking |
Theme(s) | Dependable Nano Computing |
Project(s) | 3DIM3 |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "M. Taouil and M. Masadeh and S. Hamdioui and E.J. Marinissen",
title = "Interconnect Test for 3D Stacked Memory-on-Logic",
conference = "Design, Automation & Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2014",
editors = ""
}
author = "M. Taouil and M. Masadeh and S. Hamdioui and E.J. Marinissen",
title = "Interconnect Test for 3D Stacked Memory-on-Logic",
conference = "Design, Automation & Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2014",
editors = ""
}