Interconnect Test for 3D Stacked Memory-on-Logic

Publication TypeConference Proceedings
TitleInterconnect Test for 3D Stacked Memory-on-Logic
Author(s)M. Taouil
M. Masadeh
S. Hamdioui
E.J. Marinissen
Publication DateMarch 2014
Conference NameDesign, Automation & Test in Europe
Period24-28 March 2014
LocationDresden, Germany
ISBN9783981537024
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)3D Stacking
Theme(s)Dependable Nano Computing
Project(s)3DIM3
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "M. Taouil and M. Masadeh and S. Hamdioui and E.J. Marinissen",
title = "Interconnect Test for 3D Stacked Memory-on-Logic",
conference = "Design, Automation & Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2014",
editors = ""
}