Computer Engineering Publications Database (2000-2018) Bias Temperature Instability analysis of FinFET based SRAM cells 
| Publication Type | Conference Proceedings |
|---|---|
| Title | Bias Temperature Instability analysis of FinFET based SRAM cells |
| Author(s) | M.S. Khan I.O. Agbo S. Hamdioui H. Kukner B Kaczer P. Raghavan F. Catthoor |
| Publication Date | March 2014 |
| Conference Name | Design, Automation & Test in Europe |
| Period | 24-28 March 2014 |
| Location | Dresden, Germany |
| ISBN | 978-3-9815370-2-4/DATE14/ c 2014 EDAA |
| Editor(s) | |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "M.S. Khan and I.O. Agbo and S. Hamdioui and H. Kukner and B Kaczer and P. Raghavan and F. Catthoor",
title = "Bias Temperature Instability analysis of FinFET based SRAM cells",
conference = "Design, Automation & Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2014",
editors = ""
}
author = "M.S. Khan and I.O. Agbo and S. Hamdioui and H. Kukner and B Kaczer and P. Raghavan and F. Catthoor",
title = "Bias Temperature Instability analysis of FinFET based SRAM cells",
conference = "Design, Automation & Test in Europe",
address = "Dresden, Germany",
month = "March",
year = "2014",
editors = ""
}