Computer Engineering Publications Database (2000-2018) Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.
| Publication Type | Conference Proceedings |
|---|---|
| Title | Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface. |
| Author(s) | E.J. Marinissen B de Wachter K Smith J Kiesewetter M. Taouil S. Hamdioui |
| Publication Date | October 2014 |
| Conference Name | International Test Conference |
| Period | 21-23 October 2014 |
| Location | Seattle, USA |
| ISBN | 0 |
| Editor(s) | |
| published | Published |
| Selected Publication | Yes |
| Note | |
| Topic(s) | 3D Stacking |
| Theme(s) | Dependable Nano Computing |
| Project(s) | 3DIM3 |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "E.J. Marinissen and B de Wachter and K Smith and J Kiesewetter and M. Taouil and S. Hamdioui",
title = "Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.",
conference = "International Test Conference",
address = "Seattle, USA",
month = "October",
year = "2014",
editors = ""
}
author = "E.J. Marinissen and B de Wachter and K Smith and J Kiesewetter and M. Taouil and S. Hamdioui",
title = "Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.",
conference = "International Test Conference",
address = "Seattle, USA",
month = "October",
year = "2014",
editors = ""
}