Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.

Publication TypeConference Proceedings
TitleDirect Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.
Author(s)E.J. Marinissen
B de Wachter
K Smith
J Kiesewetter
M. Taouil
S. Hamdioui
Publication DateOctober 2014
Conference NameInternational Test Conference
Period21-23 October 2014
LocationSeattle, USA
ISBN0
Editor(s)
publishedPublished
Selected PublicationYes
Note
Topic(s)3D Stacking
Theme(s)Dependable Nano Computing
Project(s)3DIM3
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "E.J. Marinissen and B de Wachter and K Smith and J Kiesewetter and M. Taouil and S. Hamdioui",
title = "Direct Probing on Large-Array Fine-Pitch Micro-Bumps of a Wide-I/O Logic-Memory Interface.",
conference = "International Test Conference",
address = "Seattle, USA",
month = "October",
year = "2014",
editors = ""
}