Layout-Based Refined NPSF Model for DRAM Characterization and Testing

Publication TypeJournal Paper
TitleLayout-Based Refined NPSF Model for DRAM Characterization and Testing
Author(s)Y Sfikas
Y Tsiatouhas
S. Hamdioui
Publication DateJune 2014
Journal NameIEEE Transactions On Very Large Scale Integration (VLSI) Systems
Volume22
Issue
Page Numbers1446-1450
ISSN1063-8210
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "Y Sfikas and Y Tsiatouhas and S. Hamdioui",
title = "Layout-Based Refined NPSF Model for DRAM Characterization and Testing",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "22",
issue = "",
month = "June",
year = "2014",
pages = "1446-1450"
}