Computer Engineering Publications Database (2000-2018) Layout-Based Refined NPSF Model for DRAM Characterization and Testing
| Publication Type | Journal Paper |
|---|---|
| Title | Layout-Based Refined NPSF Model for DRAM Characterization and Testing |
| Author(s) | Y Sfikas Y Tsiatouhas S. Hamdioui |
| Publication Date | June 2014 |
| Journal Name | IEEE Transactions On Very Large Scale Integration (VLSI) Systems |
| Volume | 22 |
| Issue | |
| Page Numbers | 1446-1450 |
| ISSN | 1063-8210 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "Y Sfikas and Y Tsiatouhas and S. Hamdioui",
title = "Layout-Based Refined NPSF Model for DRAM Characterization and Testing",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "22",
issue = "",
month = "June",
year = "2014",
pages = "1446-1450"
}
author = "Y Sfikas and Y Tsiatouhas and S. Hamdioui",
title = "Layout-Based Refined NPSF Model for DRAM Characterization and Testing",
journal = "IEEE Transactions On Very Large Scale Integration (VLSI) Systems",
volume = "22",
issue = "",
month = "June",
year = "2014",
pages = "1446-1450"
}