3D/ 2.5D stacked IC cost modeling and test flow selection
Publication Type | Conference Proceedings |
---|---|
Title | 3D/ 2.5D stacked IC cost modeling and test flow selection |
Author(s) | S. Hamdioui |
Publication Date | May 2014 |
Conference Name | IEEE 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era |
Period | 6-8 May 2014 |
Location | Santorini, Greece |
ISBN | 978-1-4799-4972-4 |
Editor(s) | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "S. Hamdioui",
title = "3D/ 2.5D stacked IC cost modeling and test flow selection",
conference = "IEEE 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era",
address = "Santorini, Greece",
month = "May",
year = "2014",
editors = ""
}
author = "S. Hamdioui",
title = "3D/ 2.5D stacked IC cost modeling and test flow selection",
conference = "IEEE 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era",
address = "Santorini, Greece",
month = "May",
year = "2014",
editors = ""
}