3D/ 2.5D stacked IC cost modeling and test flow selection

Publication TypeConference Proceedings
Title3D/ 2.5D stacked IC cost modeling and test flow selection
Author(s)S. Hamdioui
Publication DateMay 2014
Conference NameIEEE 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era
Period6-8 May 2014
LocationSantorini, Greece
ISBN978-1-4799-4972-4
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "S. Hamdioui",
title = "3D/ 2.5D stacked IC cost modeling and test flow selection",
conference = "IEEE 9th International Conference on Design & Technology of Integrated Systems in Nanoscale Era",
address = "Santorini, Greece",
month = "May",
year = "2014",
editors = ""
}