Post-Bond Interconnect Test and Diagnosis for 3D Memory Stacked on Logic

Publication TypeJournal Paper
TitlePost-Bond Interconnect Test and Diagnosis for 3D Memory Stacked on Logic
Author(s)M. Taouil
M. Masadeh
S. Hamdioui
E.J. Marinissen
Publication DateMay 2015
Journal NameIEEE Transactions on Computers
Volume
Issue99
Page Numbers13
ISSN0018-9340
publishedPublished
Selected PublicationNo
Note
Topic(s)3D Stacking
Theme(s)Dependable Nano Computing
Project(s)3DIM3
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "M. Taouil and M. Masadeh and S. Hamdioui and E.J. Marinissen",
title = "Post-Bond Interconnect Test and Diagnosis for 3D Memory Stacked on Logic",
journal = "IEEE Transactions on Computers",
volume = "",
issue = "99",
month = "May",
year = "2015",
pages = "13"
}