Computer Engineering Publications Database (2000-2018) Test Cost Modeling for 3D-Stacked ICs
| Publication Type | Conference Paper |
|---|---|
| Title | Test Cost Modeling for 3D-Stacked ICs |
| Author(s) | M. Taouil S. Hamdioui E.J. Marinissen |
| Publication Date | September 2011 |
| Conference Name | Second IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits |
| Period | 22-23 September 2011 |
| Location | Anaheim, USA |
| ISBN | t.b.s. |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Taouil and S. Hamdioui and E.J. Marinissen",
title = "Test Cost Modeling for 3D-Stacked ICs",
booktitle = "Proc. Second IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits",
address = "Anaheim, USA",
month = "September",
year = "2011",
pages = ""
}
author = "M. Taouil and S. Hamdioui and E.J. Marinissen",
title = "Test Cost Modeling for 3D-Stacked ICs",
booktitle = "Proc. Second IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits",
address = "Anaheim, USA",
month = "September",
year = "2011",
pages = ""
}