Computer Engineering Publications Database (2000-2018) On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect
| Publication Type | Conference Proceedings |
|---|---|
| Title | On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect |
| Author(s) | Y Sfikas Y Tsiatouhas M. Taouil S. Hamdioui |
| Publication Date | May 2015 |
| Conference Name | 20th IEEE European Test Symposium |
| Period | 25-29 May 2015 |
| Location | Cluj-Napoca, Romania |
| ISBN | 0 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "Y Sfikas and Y Tsiatouhas and M. Taouil and S. Hamdioui",
title = "On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect ",
conference = "20th IEEE European Test Symposium",
address = "Cluj-Napoca, Romania",
month = "May",
year = "2015",
editors = ""
}
author = "Y Sfikas and Y Tsiatouhas and M. Taouil and S. Hamdioui",
title = "On Resistive Open Defect Detection in DRAMs: The Charge Accumulation Effect ",
conference = "20th IEEE European Test Symposium",
address = "Cluj-Napoca, Romania",
month = "May",
year = "2015",
editors = ""
}