SW-based transparent in-field memory testing

Publication TypeConference Proceedings
TitleSW-based transparent in-field memory testing
Author(s)L Brasca
M Sonza Reorda
S. Hamdioui
Publication DateNovember 2015
Conference Name16th IEEE Latin-American Test Symposium
Period25-27 March 2015
LocationPuerto Vallarta, Mexico
ISBN0.0.0
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)Reliability
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "L Brasca and M Sonza Reorda and S. Hamdioui",
title = "SW-based transparent in-field memory testing",
conference = "16th IEEE Latin-American Test Symposium",
address = "Puerto Vallarta, Mexico",
month = "November",
year = "2015",
editors = ""
}