Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario
Publication Type | Conference Proceedings |
---|---|
Title | Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario |
Author(s) | C.G. Almudever A. Rubio |
Publication Date | April 2011 |
Conference Name | 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems |
Period | 13-14 April 2011 |
Location | Cottbus, Germany |
ISBN | 978-1-4244-9755-3 |
Editor(s) | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "C.G. Almudever and A. Rubio",
title = "Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario",
conference = "14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
editors = ""
}
author = "C.G. Almudever and A. Rubio",
title = "Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario",
conference = "14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
editors = ""
}