Computer Engineering Publications Database (2000-2018) Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario
| Publication Type | Conference Proceedings |
|---|---|
| Title | Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario |
| Author(s) | C.G. Almudever A. Rubio |
| Publication Date | April 2011 |
| Conference Name | 14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems |
| Period | 13-14 April 2011 |
| Location | Cottbus, Germany |
| ISBN | 978-1-4244-9755-3 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "C.G. Almudever and A. Rubio",
title = "Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario",
conference = "14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
editors = ""
}
author = "C.G. Almudever and A. Rubio",
title = "Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario",
conference = "14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
editors = ""
}