Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario

Publication TypeConference Proceedings
TitleManufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario
Author(s)C.G. Almudever
A. Rubio
Publication DateApril 2011
Conference Name14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems
Period13-14 April 2011
LocationCottbus, Germany
ISBN978-1-4244-9755-3
Editor(s)
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@proceedings{,
author = "C.G. Almudever and A. Rubio",
title = "Manufacturing Variability Analysis in Carbon Nanotube Technology: a comparison with bulk CMOS in 6T SRAM scenario",
conference = "14th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Cottbus, Germany",
month = "April",
year = "2011",
editors = ""
}