Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits

Publication TypeJournal Paper
TitleInverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits
Author(s)J. Chen
S.D. Cotofana
S. Grandhi
C. Spagnol
E. Popovici
Publication DateDecember 2015
Journal NameMicroelectronics Reliability
Volume55
Issue12
Page Numbers2754–2761
ISSN0026-2714
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "J. Chen and S.D. Cotofana and S. Grandhi and C. Spagnol and E. Popovici",
title = "Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits",
journal = "Microelectronics Reliability",
volume = "55",
issue = "12",
month = "December",
year = "2015",
pages = "2754–2761"
}