Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits
Publication Type | Journal Paper |
---|---|
Title | Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits |
Author(s) | J. Chen S.D. Cotofana S. Grandhi C. Spagnol E. Popovici |
Publication Date | December 2015 |
Journal Name | Microelectronics Reliability |
Volume | 55 |
Issue | 12 |
Page Numbers | 2754–2761 |
ISSN | 0026-2714 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "J. Chen and S.D. Cotofana and S. Grandhi and C. Spagnol and E. Popovici",
title = "Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits",
journal = "Microelectronics Reliability",
volume = "55",
issue = "12",
month = "December",
year = "2015",
pages = "2754–2761"
}
author = "J. Chen and S.D. Cotofana and S. Grandhi and C. Spagnol and E. Popovici",
title = "Inverse Gaussian Distribution Based Timing Analysis of Sub-Threshold CMOS Circuits",
journal = "Microelectronics Reliability",
volume = "55",
issue = "12",
month = "December",
year = "2015",
pages = "2754–2761"
}