Computer Engineering Publications Database (2000-2018) A supply voltage-dependent variation aware reliability evaluation model
| Publication Type | Conference Paper |
|---|---|
| Title | A supply voltage-dependent variation aware reliability evaluation model |
| Author(s) | B. Yang M. A. Quille A. Amann E. Popovici S.D. Cotofana |
| Publication Date | July 2016 |
| Conference Name | IEEE/ACM International Symposium on Nanoscale Architectures |
| Period | 18-20 July 2016 |
| Location | Beijing, China |
| ISBN | 978-1-4673-8927-3 |
| Page Numbers | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "B. Yang and M. A. Quille and A. Amann and E. Popovici and S.D. Cotofana",
title = "A supply voltage-dependent variation aware reliability evaluation model",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Beijing, China",
month = "July",
year = "2016",
pages = ""
}
author = "B. Yang and M. A. Quille and A. Amann and E. Popovici and S.D. Cotofana",
title = "A supply voltage-dependent variation aware reliability evaluation model",
booktitle = "Proc. IEEE/ACM International Symposium on Nanoscale Architectures",
address = "Beijing, China",
month = "July",
year = "2016",
pages = ""
}