Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation
Publication Type | Conference Paper |
---|---|
Title | Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation |
Author(s) | A. Amaricai N. Cucu Laurenciu O. Boncalo J. Chen S. Nimara V. Savin S.D. Cotofana |
Publication Date | November 2015 |
Conference Name | XXX Conference on Design of Circuits and Integrated Systems |
Period | 25-27 November 2015 |
Location | Estoril, Portugal |
ISBN | 978-1-4673-7229-9 |
Page Numbers | |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "A. Amaricai and N. Cucu Laurenciu and O. Boncalo and J. Chen and S. Nimara and V. Savin and S.D. Cotofana",
title = "Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation",
booktitle = "Proc. XXX Conference on Design of Circuits and Integrated Systems",
address = "Estoril, Portugal",
month = "November",
year = "2015",
pages = ""
}
author = "A. Amaricai and N. Cucu Laurenciu and O. Boncalo and J. Chen and S. Nimara and V. Savin and S.D. Cotofana",
title = "Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation",
booktitle = "Proc. XXX Conference on Design of Circuits and Integrated Systems",
address = "Estoril, Portugal",
month = "November",
year = "2015",
pages = ""
}