Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation

Publication TypeConference Paper
TitleMulti-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation
Author(s)A. Amaricai
N. Cucu Laurenciu
O. Boncalo
J. Chen
S. Nimara
V. Savin
S.D. Cotofana
Publication DateNovember 2015
Conference NameXXX Conference on Design of Circuits and Integrated Systems
Period25-27 November 2015
LocationEstoril, Portugal
ISBN978-1-4673-7229-9
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "A. Amaricai and N. Cucu Laurenciu and O. Boncalo and J. Chen and S. Nimara and V. Savin and S.D. Cotofana",
title = "Multi-Level Probabilistic Timing Error Reliability Analysis Using a Circuit Dependent Fault Map Generation",
booktitle = "Proc. XXX Conference on Design of Circuits and Integrated Systems",
address = "Estoril, Portugal",
month = "November",
year = "2015",
pages = ""
}