ROST-C: Reliability Driven Optimisation and Synthesis Techniques for Combinational Circuits

Publication TypeConference Paper
TitleROST-C: Reliability Driven Optimisation and Synthesis Techniques for Combinational Circuits
Author(s)S. Grandhi
D. McCarthy
C. Spagnol
E. Popovici
S.D. Cotofana
Publication DateOctober 2015
Conference Name33rd IEEE International Conference on Computer Design
Period18-21 October 2015
LocationNew York, USA
ISBN978-1-4673-7166-7
Page Numbers
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "S. Grandhi and D. McCarthy and C. Spagnol and E. Popovici and S.D. Cotofana",
title = "ROST-C: Reliability Driven Optimisation and Synthesis Techniques for Combinational Circuits",
booktitle = "Proc. 33rd IEEE International Conference on Computer Design",
address = "New York, USA",
month = "October",
year = "2015",
pages = ""
}