Computer Engineering Publications Database (2000-2018) On Mitigating Sense Amplifier Offset Voltage Degradation 
| Publication Type | Conference Paper |
|---|---|
| Title | On Mitigating Sense Amplifier Offset Voltage Degradation |
| Author(s) | D.H.P. Kraak I.O. Agbo M. Taouil S. Hamdioui P Weckx S. Cosemans F. Catthoor W Dehaene |
| Publication Date | November 2016 |
| Conference Name | First IEEE International Workshop on Automotive Reliability & Test |
| Period | 17-18 November 2016 |
| Location | Fort Worth, USA |
| ISBN | NA |
| Page Numbers | 5 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | Reliability |
| Theme(s) | Dependable Nano Computing |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "On Mitigating Sense Amplifier Offset Voltage Degradation",
booktitle = "Proc. First IEEE International Workshop on Automotive Reliability & Test",
address = "Fort Worth, USA",
month = "November",
year = "2016",
pages = "5"
}
author = "D.H.P. Kraak and I.O. Agbo and M. Taouil and S. Hamdioui and P Weckx and S. Cosemans and F. Catthoor and W Dehaene",
title = "On Mitigating Sense Amplifier Offset Voltage Degradation",
booktitle = "Proc. First IEEE International Workshop on Automotive Reliability & Test",
address = "Fort Worth, USA",
month = "November",
year = "2016",
pages = "5"
}