Computer Engineering Publications Database (2000-2018) On the Robustness of Memristor Based Logic Gates
| Publication Type | Conference Proceedings |
|---|---|
| Title | On the Robustness of Memristor Based Logic Gates |
| Author(s) | L. Xie H.A. Du Nguyen J. Yu M. Taouil S. Hamdioui |
| Publication Date | April 2017 |
| Conference Name | IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems |
| Period | 19-21 April 2017 |
| Location | Dresden, Germany |
| ISBN | 0000 |
| Editor(s) | |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@proceedings{,
author = "L. Xie and H.A. Du Nguyen and J. Yu and M. Taouil and S. Hamdioui",
title = "On the Robustness of Memristor Based Logic Gates",
conference = "IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Dresden, Germany",
month = "April",
year = "2017",
editors = ""
}
author = "L. Xie and H.A. Du Nguyen and J. Yu and M. Taouil and S. Hamdioui",
title = "On the Robustness of Memristor Based Logic Gates",
conference = "IEEE International Symposium on Design and Diagnostics of Electronic Circuits and Systems",
address = "Dresden, Germany",
month = "April",
year = "2017",
editors = ""
}