Two Effective Methods to Detect Anomalies in Embedded Systems 1621_two_effective_methods_to_detect_anomalies_in_embedded_syste.pdf

Publication TypeJournal Paper
TitleTwo Effective Methods to Detect Anomalies in Embedded Systems
Author(s)M. Zandrahimi
H.R. Zarandi
M. H. Mottaghi
Publication DateJanuary 2012
Journal NameMicroelectronics Journal
Volume43
Issue1
Page Numbers77-87
ISSN0026-2692
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "M. Zandrahimi and H.R. Zarandi and M. H. Mottaghi",
title = "Two Effective Methods to Detect Anomalies in Embedded Systems",
journal = "Microelectronics Journal",
volume = "43",
issue = "1",
month = "January",
year = "2012",
pages = "77-87"
}