Two Effective Methods to Detect Anomalies in Embedded Systems

Publication TypeJournal Paper
TitleTwo Effective Methods to Detect Anomalies in Embedded Systems
Author(s)M. Zandrahimi
H.R. Zarandi
M. H. Mottaghi
Publication DateJanuary 2012
Journal NameMicroelectronics Journal
Volume43
Issue1
Page Numbers77-87
ISSN0026-2692
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "M. Zandrahimi and H.R. Zarandi and M. H. Mottaghi",
title = "Two Effective Methods to Detect Anomalies in Embedded Systems",
journal = "Microelectronics Journal",
volume = "43",
issue = "1",
month = "January",
year = "2012",
pages = "77-87"
}