Two Effective Methods to Detect Anomalies in Embedded Systems
Publication Type | Journal Paper |
---|---|
Title | Two Effective Methods to Detect Anomalies in Embedded Systems |
Author(s) | M. Zandrahimi H.R. Zarandi M. H. Mottaghi |
Publication Date | January 2012 |
Journal Name | Microelectronics Journal |
Volume | 43 |
Issue | 1 |
Page Numbers | 77-87 |
ISSN | 0026-2692 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | None |
Theme(s) | None |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "M. Zandrahimi and H.R. Zarandi and M. H. Mottaghi",
title = "Two Effective Methods to Detect Anomalies in Embedded Systems",
journal = "Microelectronics Journal",
volume = "43",
issue = "1",
month = "January",
year = "2012",
pages = "77-87"
}
author = "M. Zandrahimi and H.R. Zarandi and M. H. Mottaghi",
title = "Two Effective Methods to Detect Anomalies in Embedded Systems",
journal = "Microelectronics Journal",
volume = "43",
issue = "1",
month = "January",
year = "2012",
pages = "77-87"
}