Computer Engineering Publications Database (2000-2018) A Probabilistic Method to Detect Anomalies in Embedded Systems 
| Publication Type | Conference Paper |
|---|---|
| Title | A Probabilistic Method to Detect Anomalies in Embedded Systems |
| Author(s) | M. Zandrahimi H.R. Zarandi A. Zarei |
| Publication Date | October 2010 |
| Conference Name | 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems |
| Period | 6-8 October 2010 |
| Location | Kyoto, Japan |
| ISBN | 978-1-4244-8447-8 |
| Page Numbers | 152-159 |
| published | Published |
| Selected Publication | No |
| Note | |
| Topic(s) | None |
| Theme(s) | None |
| Project(s) | None |
| Group(s) | Computer Engineering |
IEEE BibTex entry:
@inproceedings{,
author = "M. Zandrahimi and H.R. Zarandi and A. Zarei",
title = "A Probabilistic Method to Detect Anomalies in Embedded Systems",
booktitle = "Proc. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Kyoto, Japan",
month = "October",
year = "2010",
pages = "152-159"
}
author = "M. Zandrahimi and H.R. Zarandi and A. Zarei",
title = "A Probabilistic Method to Detect Anomalies in Embedded Systems",
booktitle = "Proc. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Kyoto, Japan",
month = "October",
year = "2010",
pages = "152-159"
}