A Probabilistic Method to Detect Anomalies in Embedded Systems

Publication TypeConference Paper
TitleA Probabilistic Method to Detect Anomalies in Embedded Systems
Author(s)M. Zandrahimi
H.R. Zarandi
A. Zarei
Publication DateOctober 2010
Conference Name25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems
Period6-8 October 2010
LocationKyoto, Japan
ISBN978-1-4244-8447-8
Page Numbers152-159
publishedPublished
Selected PublicationNo
Note
Topic(s)None
Theme(s)None
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@inproceedings{,
author = "M. Zandrahimi and H.R. Zarandi and A. Zarei",
title = "A Probabilistic Method to Detect Anomalies in Embedded Systems",
booktitle = "Proc. 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems",
address = "Kyoto, Japan",
month = "October",
year = "2010",
pages = "152-159"
}