Challenges and Solutions in Emerging Memory Testing
Publication Type | Journal Paper |
---|---|
Title | Challenges and Solutions in Emerging Memory Testing |
Author(s) | E. I. Vatajelu P. Prinetto M. Taouil S. Hamdioui |
Publication Date | April 2017 |
Journal Name | IEEE Transactions on Emerging Topics in Computing |
Volume | |
Issue | |
Page Numbers | |
ISSN | 2168-6750 |
published | Published |
Selected Publication | No |
Note | |
Topic(s) | Memristor Nano Devices |
Theme(s) | Dependable Nano Computing |
Project(s) | None |
Group(s) | Computer Engineering |
IEEE BibTex entry:
@article{,
author = "E. I. Vatajelu and P. Prinetto and M. Taouil and S. Hamdioui",
title = "Challenges and Solutions in Emerging Memory Testing",
journal = "IEEE Transactions on Emerging Topics in Computing",
volume = "",
issue = "",
month = "April",
year = "2017",
pages = ""
}
author = "E. I. Vatajelu and P. Prinetto and M. Taouil and S. Hamdioui",
title = "Challenges and Solutions in Emerging Memory Testing",
journal = "IEEE Transactions on Emerging Topics in Computing",
volume = "",
issue = "",
month = "April",
year = "2017",
pages = ""
}