Challenges and Solutions in Emerging Memory Testing

Publication TypeJournal Paper
TitleChallenges and Solutions in Emerging Memory Testing
Author(s)E. I. Vatajelu
P. Prinetto
M. Taouil
S. Hamdioui
Publication DateApril 2017
Journal NameIEEE Transactions on Emerging Topics in Computing
Volume
Issue
Page Numbers
ISSN2168-6750
publishedPublished
Selected PublicationNo
Note
Topic(s)Memristor Nano Devices
Theme(s)Dependable Nano Computing
Project(s)None
Group(s)Computer Engineering

IEEE BibTex entry:
@article{,
author = "E. I. Vatajelu and P. Prinetto and M. Taouil and S. Hamdioui",
title = "Challenges and Solutions in Emerging Memory Testing",
journal = "IEEE Transactions on Emerging Topics in Computing",
volume = "",
issue = "",
month = "April",
year = "2017",
pages = ""
}